本中心儀器/設備

管理規則:

  • 使用者需於中央研究院之預算管理系統設有帳號,使用費於每年四、七、十月,透過轉賬機制收取。如有未付清之使用費,將暫時停止該團隊之使用權直到付清,且管理者得要求使用者預繳與前期相同金額之使用費,方恢復其使用權。

  • 儀器僅供合格使用者,於開放時段內自行操作,且無技術員可提供委託服務。合格使用者可自行訓練新進人員,並經管理人員考核通過後,成為合格使用者。如需要管理人員進行操作訓練,相關時段之使用費以二倍計收。

  • 如有違規或不當操作造成儀器損壞,使用者除需照價賠償以便修復外,並需支付停機維修期間所有開放時段之使用費。

  • 中研院院內使用者得有七折優惠,中研院奈米計劃使用者得有五折優惠,應科中心使用者得有三折優惠。

  • 不得使用毒性化學物質(不論是否列管),或具有揮發性、放射性、爆炸性、生物活性等物質,管理人員得依個別儀器特性,拒絕其他(包含,但不受限於)如磁性、粉體等樣品之使用。若未經許可使用上述物質,該使用者所屬團隊將永久禁止使用。

儀器預約系統

    主要儀器/設備如下:

  • FIB

    The Helios dual-beam system combines FEI's best electron and ion optics, accessories and software to deliver a powerful solution for advanced nanoscale research. Electron beam source with a small kinetic energy is used to take high-resolution SEM images. The resolution can reach several nm. Due to the higher energy of Ga ion than one of the electron in the same accelerated voltage, it allows us to mill some specific structures on samples. Milling linewidth is controlled from 10 nm to tens micrometers. Additionally, for bio-sample, to avoid their deformation in an ultrahigh vacuum environment, the dual-beam system combines a cryo chamber to keep their nature property via a freeze process.

  • Nova200 NanoSEM

    Scanning Electron Microscope (SEM) Using a electron beam, surface structures can be observed directly with nm spatial resolution. Dedicate two-channel solid-state detector provides topographic or Z-contrast using back-scattered electrons. The system is also modified to serve as STEM for BF/DF/HAADF operation. Combine with the X-ray Energy Dispersive Spectroscopy (XEDS, Oxford X-Max 80 mm2 Silicon Drift Detector (SDD), the chemical composition can also be determined in a manner of point-and-click. Specimens must be vacuum compatible and in forms of thin-film or bulk with a flat surface. Particles and wet samples are not allowed. To provide a stable environment, active vibration isolator (HERZ AVI-200S) is used to support the microscope.

  • Leica Confocal Microscope (SP5)

    The Leica TCS SP5 Confocal fully covers a broad range of requirements in confocal and multiphoton imaging with excellent overall performance. The system provides the full range of scan speeds at the highest resolution. With its proven, high-efficiency SP detection (five channels simultaneously) and optional AOBS (Acousto Optical Bream Splitter), the Leica TCS SP5 delivers bright, noise-free images with minimal photo damage at high speed. The system is also the platform for the new Leica DM6000 CFS (Confocal Fixed Stage) for physiological andelectrophysiological experiments and for the new super resolution Leica TCS STED confocal microscope.

  • PHI TRIFT V nanoToF

    Time-of-Flight Secondary Mass Spectrometry Based on energetic ion bombardment, secondary ions (SIs) are generated. By accelerate SIs with constant energy, ions of different m/z require different times to pass a 2 m flight path and are separated. Using pulsed primary beam of low current, interaction depth of sub-monolayer can be controlled as static SIMS (S-SIMS). Specimens (<1" in diameter) must be UHV compatible and in forms of thin-film or bulk with a flat surface. Particles and wet samples are not allowed. To minimize the environmental interference to the high resolution work, active field canceling system (Spicer Consulting SC20) is used to control the sum of DC-5 kHz electromagnetic to be <0.07 mG and active vibration isolator (HERZ AVI-200S/M/LP) is used to support the system.

  • PHI VersaProbe

    Scanning XPS Microprobe In an ultra-high vacuum (UHV) chamber (10-7~10-8 Pa), photoelectrons are excited. As the escape depth is shallow, the information came from the top few nm. Combine with in situ ion sputtering, one can slowly remove the surface and acquire spectra from different depth to construct the depth profile. The specimen temperature can be controlled between -120 to 500 °C during analysis. In combination ith a quadrupole mass analyzer, this system also serves as a dynamic secondary ion mass spectrometer (D-SIMS) for analyzing soft materials. Specimens (<1" in diameter) must be UHV compatible and in forms of thin-film or bulk with a flat surface. Particles and wet samples are not allowed.

  • Simon Auto-Western

    Simon auto-western A Simple Western is an automated Western - no gels, no transfer devices, no blots, no film and no manual analysis. Just load your samples in Simon and press start. Simon automates all steps of the process including sample loading, size-based protein separation, immunoprobing, washing, detection and data analysis for up to 12 samples simultaneously.

  • Veeco Innova SPM

    Scanning Probe Microscope (SPM) Using a varity of probes, a wide range of surface chemical, physical, mechanical, and electrical properties can be studied with high spatial resolution ( The system is sitting on a Halcyoncs Micro 40 active vibration isolation platform. The vibration level on the surface is better than 5 dB at <10 Hz and <0 dB for higher frequencies